Analytical electron microscopy
The Analytical Electron Microscopy Laboratory offers well established analytical and imaging methods for non-destructive investigation of a wide range of solid samples (rocks, minerals, meteorites, fossils, artefacts, insects, and plants) using a JEOL JXA 6610LV scanning electron microscope (SEM) and a JEOL JXA-8530F electron probe micro analyzer (EPMA).
Our analytical electron microscopes are capable of qualitatively and quantitatively measuring the concentrations of all elements from B to U by means of wavelength-dispersive spectrometry (WDS) and energy-dispersive spectrometry (EDS). The applied analytical technique combines micron-scale chemical analyses with scanning electron microscopy and is capable of large- and small-scale element mapping of specimens. Because of its unique combination of spatial resolution with high analytical precision, our EPMA is one of the few state-of-the-art instruments in Austria.
To achieve high precision analysis, a profound sample preparation is essential. Therefore, we provide well-equipped sample preparation facilities. Beside different polishing disks, two sputtering/coating units are available. A LEICA EM SCD 500 for platinum sputtering and carbon coating and a HUMMER V for gold sputtering.